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Source RCUK EPSRC Data

Details for Topic Number 82

gate transistor effect dielectric oxide ultra capacitance mo leakage voltage threshold nanoelectronic mobility interface channel

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Words in Topic

65 - gate

59 - transistor

44 - effect

37 - dielectric

23 - oxide

23 - ultra

22 - capacitance

19 - mo

17 - leakage

17 - voltage

15 - threshold

14 - nanoelectronic

12 - mobility

11 - interface

10 - channel

Key Grants